GB1017362A

GB1017362A – Improvements in or relating to measuring gauges
– Google Patents

GB1017362A – Improvements in or relating to measuring gauges
– Google Patents
Improvements in or relating to measuring gauges

Info

Publication number
GB1017362A

GB1017362A
GB27476/63A
GB2747663A
GB1017362A
GB 1017362 A
GB1017362 A
GB 1017362A
GB 27476/63 A
GB27476/63 A
GB 27476/63A
GB 2747663 A
GB2747663 A
GB 2747663A
GB 1017362 A
GB1017362 A
GB 1017362A
Authority
GB
United Kingdom
Prior art keywords
gauge
traverse mechanism
screws
disc
thickness
Prior art date
1963-07-11
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Expired

Application number
GB27476/63A
Inventor
Timothy John Archer D Avis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

EK Cole Ltd

Original Assignee
EK Cole Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1963-07-11
Filing date
1963-07-11
Publication date
1966-01-19

1963-07-11
Application filed by EK Cole Ltd
filed
Critical
EK Cole Ltd

1963-07-11
Priority to GB27476/63A
priority
Critical
patent/GB1017362A/en

1964-07-07
Priority to US380766A
priority
patent/US3306103A/en

1966-01-19
Publication of GB1017362A
publication
Critical
patent/GB1017362A/en

Status
Expired
legal-status
Critical
Current

Links

Espacenet

Global Dossier

Discuss

Classifications

G—PHYSICS

G01—MEASURING; TESTING

G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00

G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material

G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption

G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film

G—PHYSICS

G01—MEASURING; TESTING

G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means

G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance

G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance

G01N27/223—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance for determining moisture content, e.g. humidity

Abstract

1,017,362. Thickness and moisture gauges. E.K. COLE Ltd. July 6,1964 [July 11, 1963], No. 27476/63. Heading G1A. A gauge for measuring such characteristics, of a web or strip of material, as thickness or moisture content, is arranged to traverse the material and has means synchronized with the traverse mechanism to vary the value of an impedance in the circuit of the gauge automatically in accordance with a predetermined programme to correct or reduce, in the output of the gauge, the effect of any mechanical imperfections in the traverse mechanism. In a thickness gauge using a radiation system, the source and detector may be mounted on the opposite sides of the material or, in the backscatter type of arrangement, on the same side as a single unit. In the arrangement of Fig. 2 the detector 1, an ionization chamber, and the source 15, move on respective rails or rods 11, 12, driven by chains 16, 17 mechanically coupled to the appropriate housings 13, 14. The chains are driven by a motor 28 which also provides the drive for the compensation unit 38, through a gear wheel 37 on shaft 36. The shaft 36 drives, through gear wheels 41-44, (Fig. 3 not shown) a disc 39 carrying a number of screws 40, so that the angular position of the disc 39 bears a constant relationship to the position of the gauge on the traverse mechanism. The screws 40 are adjusted to correspond with errors in measurements obtained at corresponding positions of the gauge along the traverse mechanism. As the disc revolves, the screws abut against a cam 48 mounted on an arm 46 which is caused to be raised or lowered, its free end being coupled through gears 50, 51 to a variable resistor 52, which forms part of the detector circuit, the value of the resistor being varied so that a true measurement is obtain in the meter (Fig. 1, not shown). The invention also has application in moisture gauges, where the plates of a capacitor are mounted either side of the material.

GB27476/63A
1963-07-11
1963-07-11
Improvements in or relating to measuring gauges

Expired

GB1017362A
(en)

Priority Applications (2)

Application Number
Priority Date
Filing Date
Title

GB27476/63A

GB1017362A
(en)

1963-07-11
1963-07-11
Improvements in or relating to measuring gauges

US380766A

US3306103A
(en)

1963-07-11
1964-07-07
Error compensation for measuring gauges

Applications Claiming Priority (1)

Application Number
Priority Date
Filing Date
Title

GB27476/63A

GB1017362A
(en)

1963-07-11
1963-07-11
Improvements in or relating to measuring gauges

Publications (1)

Publication Number
Publication Date

GB1017362A
true

GB1017362A
(en)

1966-01-19

Family
ID=10260215
Family Applications (1)

Application Number
Title
Priority Date
Filing Date

GB27476/63A
Expired

GB1017362A
(en)

1963-07-11
1963-07-11
Improvements in or relating to measuring gauges

Country Status (2)

Country
Link

US
(1)

US3306103A
(en)

GB
(1)

GB1017362A
(en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

US3529162A
(en)

*

1967-05-02
1970-09-15
Industrial Nucleonics Corp
Absorption curve matching circuit in nucleonic measuring system

US4276480A
(en)

*

1979-09-28
1981-06-30
Accuray Corporation
Sensor position independent material property determination using radiant energy

US5010766A
(en)

*

1989-11-30
1991-04-30
Impact Systems, Inc.
Error compensation for measuring gauges

US5773714A
(en)

*

1997-02-19
1998-06-30
Honeywell-Measurex Corporation
Scanner beam dynamic deflection measurement system and method

US8564851B2
(en)

*

2011-10-25
2013-10-22
Honeywell Asca Inc.
Scanner belt load and stretch compensation control system

Family Cites Families (3)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

GB817371A
(en)

*

1955-03-25
1959-07-29
Cole E K Ltd
Improvements relating to nucleonic thickness gauges

US3084314A
(en)

*

1959-08-28
1963-04-02
Lab For Electronics Inc
Thickness control servosystem

US3190261A
(en)

*

1960-09-28
1965-06-22
Lab For Electronics Inc
Control system

1963

1963-07-11
GB
GB27476/63A
patent/GB1017362A/en
not_active
Expired

1964

1964-07-07
US
US380766A
patent/US3306103A/en
not_active
Expired – Lifetime

Also Published As

Publication number
Publication date

US3306103A
(en)

1967-02-28

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