AU8244091A

AU8244091A – High-resolution vision system for part inspection
– Google Patents

AU8244091A – High-resolution vision system for part inspection
– Google Patents
High-resolution vision system for part inspection

Info

Publication number
AU8244091A

AU8244091A
AU82440/91A
AU8244091A
AU8244091A
AU 8244091 A
AU8244091 A
AU 8244091A
AU 82440/91 A
AU82440/91 A
AU 82440/91A
AU 8244091 A
AU8244091 A
AU 8244091A
AU 8244091 A
AU8244091 A
AU 8244091A
Authority
AU
Australia
Prior art keywords
vision system
part inspection
resolution vision
resolution
inspection
Prior art date
1990-09-17
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Granted

Application number
AU82440/91A
Other versions

AU644466B2
(en

Inventor
Randy K. Baird
James P. Martin
Stanley P. Turcheck Jr.
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

FMC Corp

Original Assignee
FMC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1990-09-17
Filing date
1991-08-13
Publication date
1992-03-19

1991-08-13
Application filed by FMC Corp
filed
Critical
FMC Corp

1992-03-19
Publication of AU8244091A
publication
Critical
patent/AU8244091A/en

1993-12-09
Application granted
granted
Critical

1993-12-09
Publication of AU644466B2
publication
Critical
patent/AU644466B2/en

2011-08-13
Anticipated expiration
legal-status
Critical

Status
Ceased
legal-status
Critical
Current

Links

Espacenet

Global Dossier

Discuss

Classifications

G—PHYSICS

G01—MEASURING; TESTING

G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

G01B11/00—Measuring arrangements characterised by the use of optical techniques

G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

AU82440/91A
1990-09-17
1991-08-13
High-resolution vision system for part inspection

Ceased

AU644466B2
(en)

Applications Claiming Priority (2)

Application Number
Priority Date
Filing Date
Title

US583256

1984-03-01

US07/583,256

US5103304A
(en)

1990-09-17
1990-09-17
High-resolution vision system for part inspection

Publications (2)

Publication Number
Publication Date

AU8244091A
true

AU8244091A
(en)

1992-03-19

AU644466B2

AU644466B2
(en)

1993-12-09

Family
ID=24332341
Family Applications (1)

Application Number
Title
Priority Date
Filing Date

AU82440/91A
Ceased

AU644466B2
(en)

1990-09-17
1991-08-13
High-resolution vision system for part inspection

Country Status (9)

Country
Link

US
(1)

US5103304A
(en)

JP
(1)

JPH04305774A
(en)

AU
(1)

AU644466B2
(en)

CA
(1)

CA2050568A1
(en)

CH
(1)

CH682984A5
(en)

DE
(1)

DE4128753A1
(en)

ES
(1)

ES2035793B1
(en)

FR
(1)

FR2666883B1
(en)

IT
(1)

IT1251478B
(en)

Cited By (1)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

US5954583A
(en)

*

1992-11-05
1999-09-21
Com21 Limited
Secure access control system

Families Citing this family (8)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

AU645123B2
(en)

*

1990-09-24
1994-01-06
Fmc Corporation
Automatic windowing for article recognition

IL99823A0
(en)

*

1990-11-16
1992-08-18
Orbot Instr Ltd
Optical inspection method and apparatus

US5287293A
(en)

*

1990-12-31
1994-02-15
Industrial Technology Research Institute
Method and apparatus for inspecting the contours of a gear

US5732147A
(en)

*

1995-06-07
1998-03-24
Agri-Tech, Inc.
Defective object inspection and separation system using image analysis and curvature transformation

DE19713521B4
(en)

*

1997-04-02
2004-09-23
Festo Ag & Co

Device for recognizing incorrectly oriented and / or parts deviating from a predetermined pattern

US6330354B1
(en)

1997-05-01
2001-12-11
International Business Machines Corporation
Method of analyzing visual inspection image data to find defects on a device

KR100533758B1
(en)

*

2003-02-25
2005-12-06
엘에스전선 주식회사
Apparatus for acquiring image information using array of light electronic device image acquisition unit

CN110940270B
(en)

*

2019-10-30
2022-04-12
深圳市凯中精密技术股份有限公司
Detection method and detection device for connector PIN position degree

Family Cites Families (15)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

US4457434A
(en)

*

1982-02-01
1984-07-03
Fmc Corporation
Apparatus for orienting, singulating and sizing mushrooms and like objects

US4608709A
(en)

*

1983-03-08
1986-08-26
Owens-Illinois, Inc.
Method and apparatus for gauging containers

JPS60263807A
(en)

*

1984-06-12
1985-12-27
Dainippon Screen Mfg Co Ltd
Instument for inspecting pattern defect of printed wiring board

US4619356A
(en)

*

1984-08-15
1986-10-28
Fmc Corporation
Programmable parts feeder

GB2175396B
(en)

*

1985-05-22
1989-06-28
Filler Protection Developments
Apparatus for examining objects

US4707734A
(en)

*

1985-06-17
1987-11-17
The Perkin-Elmer Corporation
Coarse flaw detector for printed circuit board inspection

US4678920A
(en)

*

1985-06-17
1987-07-07
General Motors Corporation
Machine vision method and apparatus

JPS62173731A
(en)

*

1986-01-28
1987-07-30
Toshiba Corp
Inspection device for surface of article to be inspected

US4784493A
(en)

*

1986-06-11
1988-11-15
Fmc Corporation
Element recognition and orientation

US4711579A
(en)

*

1986-08-12
1987-12-08
H. Fred Johnston
System for automatically inspecting a flat workpiece for holes

JPH0671038B2
(en)

*

1987-03-31
1994-09-07
株式会社東芝

Crystal defect recognition processing method

JP2512871B2
(en)

*

1987-04-23
1996-07-03
株式会社ニコン

Pattern measuring device

US4845558A
(en)

*

1987-12-03
1989-07-04
Kla Instruments Corporation
Method and apparatus for detecting defects in repeated microminiature patterns

GB8809455D0
(en)

*

1988-04-21
1988-05-25
Bp Chem Int Ltd
Ruminant animal feedstuffs

JPH0276081A
(en)

*

1988-09-13
1990-03-15
Yokogawa Electric Corp
Pattern inspection device

1990

1990-09-17
US
US07/583,256
patent/US5103304A/en
not_active
Expired – Lifetime

1991

1991-08-13
AU
AU82440/91A
patent/AU644466B2/en
not_active
Ceased

1991-08-29
DE
DE4128753A
patent/DE4128753A1/en
not_active
Withdrawn

1991-09-03
CA
CA002050568A
patent/CA2050568A1/en
not_active
Abandoned

1991-09-04
CH
CH2597/91A
patent/CH682984A5/en
not_active
IP Right Cessation

1991-09-06
JP
JP3254298A
patent/JPH04305774A/en
active
Pending

1991-09-11
ES
ES9102026A
patent/ES2035793B1/en
not_active
Expired – Fee Related

1991-09-17
FR
FR9111448A
patent/FR2666883B1/en
not_active
Expired – Fee Related

1991-09-17
IT
ITMI912445A
patent/IT1251478B/en
active
IP Right Grant

Cited By (1)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

US5954583A
(en)

*

1992-11-05
1999-09-21
Com21 Limited
Secure access control system

Also Published As

Publication number
Publication date

CH682984A5
(en)

1993-12-31

US5103304A
(en)

1992-04-07

JPH04305774A
(en)

1992-10-28

IT1251478B
(en)

1995-05-15

FR2666883B1
(en)

1995-11-17

ES2035793B1
(en)

1994-04-16

FR2666883A1
(en)

1992-03-20

ES2035793A1
(en)

1993-04-16

ITMI912445A1
(en)

1993-03-17

ITMI912445D0
(en)

1991-09-17

AU644466B2
(en)

1993-12-09

DE4128753A1
(en)

1992-03-19

CA2050568A1
(en)

1992-03-18

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Legal Events

Date
Code
Title
Description

2002-03-14
MK14
Patent ceased section 143(a) (annual fees not paid) or expired

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