AU8244091A – High-resolution vision system for part inspection
– Google Patents
AU8244091A – High-resolution vision system for part inspection
– Google Patents
High-resolution vision system for part inspection
Info
Publication number
AU8244091A
AU8244091A
AU82440/91A
AU8244091A
AU8244091A
AU 8244091 A
AU8244091 A
AU 8244091A
AU 82440/91 A
AU82440/91 A
AU 82440/91A
AU 8244091 A
AU8244091 A
AU 8244091A
AU 8244091 A
AU8244091 A
AU 8244091A
Authority
AU
Australia
Prior art keywords
vision system
part inspection
resolution vision
resolution
inspection
Prior art date
1990-09-17
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
AU82440/91A
Other versions
AU644466B2
(en
Inventor
Randy K. Baird
James P. Martin
Stanley P. Turcheck Jr.
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FMC Corp
Original Assignee
FMC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1990-09-17
Filing date
1991-08-13
Publication date
1992-03-19
1991-08-13
Application filed by FMC Corp
filed
Critical
FMC Corp
1992-03-19
Publication of AU8244091A
publication
Critical
patent/AU8244091A/en
1993-12-09
Application granted
granted
Critical
1993-12-09
Publication of AU644466B2
publication
Critical
patent/AU644466B2/en
2011-08-13
Anticipated expiration
legal-status
Critical
Status
Ceased
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
G—PHYSICS
G01—MEASURING; TESTING
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00—Measuring arrangements characterised by the use of optical techniques
G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
AU82440/91A
1990-09-17
1991-08-13
High-resolution vision system for part inspection
Ceased
AU644466B2
(en)
Applications Claiming Priority (2)
Application Number
Priority Date
Filing Date
Title
US583256
1984-03-01
US07/583,256
US5103304A
(en)
1990-09-17
1990-09-17
High-resolution vision system for part inspection
Publications (2)
Publication Number
Publication Date
AU8244091A
true
AU8244091A
(en)
1992-03-19
AU644466B2
AU644466B2
(en)
1993-12-09
Family
ID=24332341
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
AU82440/91A
Ceased
AU644466B2
(en)
1990-09-17
1991-08-13
High-resolution vision system for part inspection
Country Status (9)
Country
Link
US
(1)
US5103304A
(en)
JP
(1)
JPH04305774A
(en)
AU
(1)
AU644466B2
(en)
CA
(1)
CA2050568A1
(en)
CH
(1)
CH682984A5
(en)
DE
(1)
DE4128753A1
(en)
ES
(1)
ES2035793B1
(en)
FR
(1)
FR2666883B1
(en)
IT
(1)
IT1251478B
(en)
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US5954583A
(en)
*
1992-11-05
1999-09-21
Com21 Limited
Secure access control system
Families Citing this family (8)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
AU645123B2
(en)
*
1990-09-24
1994-01-06
Fmc Corporation
Automatic windowing for article recognition
IL99823A0
(en)
*
1990-11-16
1992-08-18
Orbot Instr Ltd
Optical inspection method and apparatus
US5287293A
(en)
*
1990-12-31
1994-02-15
Industrial Technology Research Institute
Method and apparatus for inspecting the contours of a gear
US5732147A
(en)
*
1995-06-07
1998-03-24
Agri-Tech, Inc.
Defective object inspection and separation system using image analysis and curvature transformation
DE19713521B4
(en)
*
1997-04-02
2004-09-23
Festo Ag & Co
Device for recognizing incorrectly oriented and / or parts deviating from a predetermined pattern
US6330354B1
(en)
1997-05-01
2001-12-11
International Business Machines Corporation
Method of analyzing visual inspection image data to find defects on a device
KR100533758B1
(en)
*
2003-02-25
2005-12-06
엘에스전선 주식회사
Apparatus for acquiring image information using array of light electronic device image acquisition unit
CN110940270B
(en)
*
2019-10-30
2022-04-12
深圳市凯中精密技术股份有限公司
Detection method and detection device for connector PIN position degree
Family Cites Families (15)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US4457434A
(en)
*
1982-02-01
1984-07-03
Fmc Corporation
Apparatus for orienting, singulating and sizing mushrooms and like objects
US4608709A
(en)
*
1983-03-08
1986-08-26
Owens-Illinois, Inc.
Method and apparatus for gauging containers
JPS60263807A
(en)
*
1984-06-12
1985-12-27
Dainippon Screen Mfg Co Ltd
Instument for inspecting pattern defect of printed wiring board
US4619356A
(en)
*
1984-08-15
1986-10-28
Fmc Corporation
Programmable parts feeder
GB2175396B
(en)
*
1985-05-22
1989-06-28
Filler Protection Developments
Apparatus for examining objects
US4707734A
(en)
*
1985-06-17
1987-11-17
The Perkin-Elmer Corporation
Coarse flaw detector for printed circuit board inspection
US4678920A
(en)
*
1985-06-17
1987-07-07
General Motors Corporation
Machine vision method and apparatus
JPS62173731A
(en)
*
1986-01-28
1987-07-30
Toshiba Corp
Inspection device for surface of article to be inspected
US4784493A
(en)
*
1986-06-11
1988-11-15
Fmc Corporation
Element recognition and orientation
US4711579A
(en)
*
1986-08-12
1987-12-08
H. Fred Johnston
System for automatically inspecting a flat workpiece for holes
JPH0671038B2
(en)
*
1987-03-31
1994-09-07
株式会社東芝
Crystal defect recognition processing method
JP2512871B2
(en)
*
1987-04-23
1996-07-03
株式会社ニコン
Pattern measuring device
US4845558A
(en)
*
1987-12-03
1989-07-04
Kla Instruments Corporation
Method and apparatus for detecting defects in repeated microminiature patterns
GB8809455D0
(en)
*
1988-04-21
1988-05-25
Bp Chem Int Ltd
Ruminant animal feedstuffs
JPH0276081A
(en)
*
1988-09-13
1990-03-15
Yokogawa Electric Corp
Pattern inspection device
1990
1990-09-17
US
US07/583,256
patent/US5103304A/en
not_active
Expired – Lifetime
1991
1991-08-13
AU
AU82440/91A
patent/AU644466B2/en
not_active
Ceased
1991-08-29
DE
DE4128753A
patent/DE4128753A1/en
not_active
Withdrawn
1991-09-03
CA
CA002050568A
patent/CA2050568A1/en
not_active
Abandoned
1991-09-04
CH
CH2597/91A
patent/CH682984A5/en
not_active
IP Right Cessation
1991-09-06
JP
JP3254298A
patent/JPH04305774A/en
active
Pending
1991-09-11
ES
ES9102026A
patent/ES2035793B1/en
not_active
Expired – Fee Related
1991-09-17
FR
FR9111448A
patent/FR2666883B1/en
not_active
Expired – Fee Related
1991-09-17
IT
ITMI912445A
patent/IT1251478B/en
active
IP Right Grant
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US5954583A
(en)
*
1992-11-05
1999-09-21
Com21 Limited
Secure access control system
Also Published As
Publication number
Publication date
CH682984A5
(en)
1993-12-31
US5103304A
(en)
1992-04-07
JPH04305774A
(en)
1992-10-28
IT1251478B
(en)
1995-05-15
FR2666883B1
(en)
1995-11-17
ES2035793B1
(en)
1994-04-16
FR2666883A1
(en)
1992-03-20
ES2035793A1
(en)
1993-04-16
ITMI912445A1
(en)
1993-03-17
ITMI912445D0
(en)
1991-09-17
AU644466B2
(en)
1993-12-09
DE4128753A1
(en)
1992-03-19
CA2050568A1
(en)
1992-03-18
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Legal Events
Date
Code
Title
Description
2002-03-14
MK14
Patent ceased section 143(a) (annual fees not paid) or expired