GB1040630A – A method of determining the specific resistance of a semiconductor material in the from of a thin layer
– Google Patents
GB1040630A – A method of determining the specific resistance of a semiconductor material in the from of a thin layer
– Google Patents
A method of determining the specific resistance of a semiconductor material in the from of a thin layer
Info
Publication number
GB1040630A
GB1040630A
GB24662/63A
GB2466263A
GB1040630A
GB 1040630 A
GB1040630 A
GB 1040630A
GB 24662/63 A
GB24662/63 A
GB 24662/63A
GB 2466263 A
GB2466263 A
GB 2466263A
GB 1040630 A
GB1040630 A
GB 1040630A
Authority
GB
United Kingdom
Prior art keywords
determining
semiconductor material
thin layer
specific resistance
resistance
Prior art date
1962-07-17
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB24662/63A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Schuckertwerke AG
Siemens AG
Original Assignee
Siemens Schuckertwerke AG
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1962-07-17
Filing date
1963-06-20
Publication date
1966-09-01
1963-06-20
Application filed by Siemens Schuckertwerke AG, Siemens AG
filed
Critical
Siemens Schuckertwerke AG
1966-09-01
Publication of GB1040630A
publication
Critical
patent/GB1040630A/en
Status
Expired
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/26—Testing of individual semiconductor devices
G01R31/2607—Circuits therefor
G01R31/2637—Circuits therefor for testing other individual devices
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
GB24662/63A
1962-07-17
1963-06-20
A method of determining the specific resistance of a semiconductor material in the from of a thin layer
Expired
GB1040630A
(en)
Applications Claiming Priority (1)
Application Number
Priority Date
Filing Date
Title
DES0080435
1962-07-17
Publications (1)
Publication Number
Publication Date
GB1040630A
true
GB1040630A
(en)
1966-09-01
Family
ID=7508868
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
GB24662/63A
Expired
GB1040630A
(en)
1962-07-17
1963-06-20
A method of determining the specific resistance of a semiconductor material in the from of a thin layer
Country Status (4)
Country
Link
US
(1)
US3287637A
(en)
JP
(1)
JPS409924B1
(en)
CH
(1)
CH399588A
(en)
GB
(1)
GB1040630A
(en)
Families Citing this family (11)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US3416078A
(en)
*
1965-07-08
1968-12-10
Motorola Inc
Method of determining resistivity of a thin layer
US3381206A
(en)
*
1965-10-18
1968-04-30
Army Usa
Method and apparatus for measurement of incremental resistances with capacitively coupled probe means
US3624496A
(en)
*
1969-12-31
1971-11-30
Nasa
Method and apparatus for swept-frequency impedance measurements of welds
US3735253A
(en)
*
1971-09-23
1973-05-22
Aluminium Comp
Method and means for measuring electrode resistance
US3974443A
(en)
*
1975-01-02
1976-08-10
International Business Machines Corporation
Conductive line width and resistivity measuring system
US4024561A
(en)
*
1976-04-01
1977-05-17
International Business Machines Corporation
Field effect transistor monitors
US4565966A
(en)
*
1983-03-07
1986-01-21
Kollmorgen Technologies Corporation
Method and apparatus for testing of electrical interconnection networks
US4560924A
(en)
*
1983-07-22
1985-12-24
Magnetic Peripherals Inc.
Flatness measuring apparatus
DE3505387A1
(en)
*
1985-02-16
1986-08-28
W.C. Heraeus Gmbh, 6450 Hanau
SENSOR FOR MEASURING ELECTRICAL PROPERTIES IN THE ELECTRICAL FIELD
US5347226A
(en)
*
1992-11-16
1994-09-13
National Semiconductor Corporation
Array spreading resistance probe (ASRP) method for profile extraction from semiconductor chips of cellular construction
CN104677953B
(en)
*
2015-02-27
2018-01-30
山西潞安太阳能科技有限责任公司
A kind of method of quick detection evil mind piece
Family Cites Families (12)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US2351201A
(en)
*
1942-07-16
1944-06-13
Western Electric Co
Method of and means for measuring
US2428700A
(en)
*
1943-09-17
1947-10-07
Wolgen Company
Capacitative feed-back device for electrical testing
US2631188A
(en)
*
1949-10-06
1953-03-10
Gen Electric
Electrical testing apparatus
US2752434A
(en)
*
1949-10-19
1956-06-26
Gen Electric
Magneto-responsive device
US2766421A
(en)
*
1952-02-26
1956-10-09
Newmont Mining Corp
Method and apparatus for geophysical exploration
US2966628A
(en)
*
1954-02-25
1960-12-27
Frieseke And Hoepfner G M B H
System for measuring moisture content of paper or the like
US2802173A
(en)
*
1954-03-01
1957-08-06
Phillips Petroleum Co
Core saturation distribution measurement and apparatus therefor
US2871446A
(en)
*
1955-01-28
1959-01-27
Continental Oil Co
Wide-range resistance and resistivity measuring apparatus
US2934700A
(en)
*
1955-05-27
1960-04-26
Charles E Holaday
Apparatus for determining the oil content of substances
US3031616A
(en)
*
1957-07-18
1962-04-24
Hummel Heinz
Apparatus for analyzing gaseous or liquid mixtures
DE1089887B
(en)
*
1959-11-21
1960-09-29
Siemens Ag
Method and device for determining the electrical resistance of a body made of an extremely pure semiconductor material for electronic purposes
FR1253531A
(en)
*
1960-03-24
1961-02-10
Hoechst Ag
Method and apparatus for measuring variations in thickness of continuous threads
1963
1963-05-03
CH
CH559363A
patent/CH399588A/en
unknown
1963-06-20
GB
GB24662/63A
patent/GB1040630A/en
not_active
Expired
1963-07-10
US
US294116A
patent/US3287637A/en
not_active
Expired – Lifetime
1963-07-17
JP
JP3872663A
patent/JPS409924B1/ja
active
Pending
Also Published As
Publication number
Publication date
JPS409924B1
(en)
1965-05-20
US3287637A
(en)
1966-11-22
CH399588A
(en)
1965-09-30
Similar Documents
Publication
Publication Date
Title
SE389545B
(en)
1976-11-08
SCREW FOR LAYER DENSITY MATERIAL
GB1122489A
(en)
1968-08-07
Method of diffusing material into a substrate
GB1042992A
(en)
1966-09-21
Method of assaying and devices for the application of said method
GB1040630A
(en)
1966-09-01
A method of determining the specific resistance of a semiconductor material in the from of a thin layer
AU4801772A
(en)
1974-04-26
Thin layer semiconductor device
GB1196862A
(en)
1970-07-01
Method of Fabricating Superconducting Material.
CH403536A
(en)
1965-11-30
Flexible abrasive material
DK114005B
(en)
1969-05-19
Coating material.
GB1030576A
(en)
1966-05-25
Improvements in footwear and in the manufacture thereof
CA673218A
(en)
1963-10-29
Method and device for determining semiconductor thickness and resistivity
CA562851A
(en)
1958-09-02
Boundary layer control apparatus for compressors
MY6600084A
(en)
1966-12-31
Bismuth iodide fcomplexes and process for the manufacture thereof
CA643448A
(en)
1962-06-26
Apparatus for determining the quantity of contaminant in a substance
FR1320683A
(en)
1963-03-08
Improvement in coating processes
CA641081A
(en)
1962-05-15
Radioactivity-type material quantity gauge
CA769323A
(en)
1967-10-10
Semiconductor material and method of manufacture
AU278174B2
(en)
1965-12-23
Method and apparatus for determining the electrical resistance of moving bodies of material
IT986860B
(en)
1975-01-30
VALUE FEEDING DEVICE FOR NATRIC AND SIMILAR ADDITIO CALCULATORS
AU259889B2
(en)
1963-05-02
Semiconductor material
CA657816A
(en)
1963-02-12
Material inspecting device
CA804234A
(en)
1969-01-14
Semiconductor device and fabrication method therefor
IE23924L
(en)
1959-11-14
Semi-conductor materials.
CA561219A
(en)
1958-08-05
Material elevator
GB1030281A
(en)
1966-05-18
Apparatus for determining the resistance of moving bodies
CA605859A
(en)
1960-09-27
Forming a mat or layer of discrete material
None