GB1173155A – Improvements in or relating to Ion Chambers
– Google Patents
GB1173155A – Improvements in or relating to Ion Chambers
– Google Patents
Improvements in or relating to Ion Chambers
Info
Publication number
GB1173155A
GB1173155A
GB40108/66A
GB4010866A
GB1173155A
GB 1173155 A
GB1173155 A
GB 1173155A
GB 40108/66 A
GB40108/66 A
GB 40108/66A
GB 4010866 A
GB4010866 A
GB 4010866A
GB 1173155 A
GB1173155 A
GB 1173155A
Authority
GB
United Kingdom
Prior art keywords
window
electrodes
sept
filters
central
Prior art date
1966-09-08
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB40108/66A
Inventor
John Rathbone Rhodes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Atomic Energy Authority
Original Assignee
UK Atomic Energy Authority
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1966-09-08
Filing date
1966-09-08
Publication date
1969-12-03
1966-09-08
Application filed by UK Atomic Energy Authority
filed
Critical
UK Atomic Energy Authority
1966-09-08
Priority to GB40108/66A
priority
Critical
patent/GB1173155A/en
1966-09-27
Priority to DE1966U0013115
priority
patent/DE1564995B2/en
1966-12-16
Priority to US602355A
priority
patent/US3514602A/en
1969-12-03
Publication of GB1173155A
publication
Critical
patent/GB1173155A/en
Status
Expired
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
H—ELECTRICITY
H01—ELECTRIC ELEMENTS
H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
H01J47/02—Ionisation chambers
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/07—Investigating materials by wave or particle radiation secondary emission
G01N2223/076—X-ray fluorescence
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/10—Different kinds of radiation or particles
G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
G01N2223/1013—Different kinds of radiation or particles electromagnetic radiation gamma
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/10—Different kinds of radiation or particles
G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
G01N2223/1016—X-ray
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/20—Sources of radiation
G01N2223/202—Sources of radiation isotopes
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/30—Accessories, mechanical or electrical features
G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/30—Accessories, mechanical or electrical features
G01N2223/317—Accessories, mechanical or electrical features windows
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/50—Detectors
G01N2223/502—Detectors ionisation chamber
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/60—Specific applications or type of materials
G01N2223/61—Specific applications or type of materials thin films, coatings
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00—Investigating materials by wave or particle radiation
G01N2223/60—Specific applications or type of materials
G01N2223/633—Specific applications or type of materials thickness, density, surface weight (unit area)
Abstract
1,173,155. Radiation detector. UNITED KINGDOM ATOMIC ENERGY AUTHORITY. Sept. 1, 1967 [Sept. 8, 1966], No. 40108/66. Heading G1A. [Also in Division H1] In a measuring head comprising a differential ion chamber 2 having spaced positively and negatively polarized electrodes 5 and a substantially central collecting electrode 4, and an access window 3, each half of which is associated with a filter of a balanced differential pair 6, 7, one or more sources 10 are mounted on the outward side of a shield 8 covering a central portion of the window so that back scatter from a sample irradiated therby passes through the filters and enters the respective spaces between the positive and negative electrodes and the central electrode, and the charge on the central electrode indicates the difference directly. The electrodes may be semicylindrical in form and the spaces may be filled with argon. A thin rear window permits the escape of high energy radiation and may with the front window comprise aluminized plastic sheet. The apparatus is described in connection with measuring a hot dipped galvanized zinc coating on steel, and for this purpose copper and nickel filters are exemplified.
GB40108/66A
1966-09-08
1966-09-08
Improvements in or relating to Ion Chambers
Expired
GB1173155A
(en)
Priority Applications (3)
Application Number
Priority Date
Filing Date
Title
GB40108/66A
GB1173155A
(en)
1966-09-08
1966-09-08
Improvements in or relating to Ion Chambers
DE1966U0013115
DE1564995B2
(en)
1966-09-08
1966-09-27
MEASURING DEVICE FOR DETERMINING THE CHARACTERISTIC X-RAY RADIATION EMITTED BY A TARGET MATERIAL
US602355A
US3514602A
(en)
1966-09-08
1966-12-16
Differential ion chambers
Applications Claiming Priority (1)
Application Number
Priority Date
Filing Date
Title
GB40108/66A
GB1173155A
(en)
1966-09-08
1966-09-08
Improvements in or relating to Ion Chambers
Publications (1)
Publication Number
Publication Date
GB1173155A
true
GB1173155A
(en)
1969-12-03
Family
ID=10413234
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
GB40108/66A
Expired
GB1173155A
(en)
1966-09-08
1966-09-08
Improvements in or relating to Ion Chambers
Country Status (3)
Country
Link
US
(1)
US3514602A
(en)
DE
(1)
DE1564995B2
(en)
GB
(1)
GB1173155A
(en)
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
EP0475305A2
(en)
*
1990-09-10
1992-03-18
Shimadzu Corporation
Apparatus and method for inverse photoemission spectroscopy
Families Citing this family (4)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
GB8515552D0
(en)
*
1985-06-19
1985-07-24
Boyle Controls Ltd
Coating weight & thickness gauges
US5633501A
(en)
*
1995-06-07
1997-05-27
Pittway Corporation
Combination photoelectric and ionization smoke detector
DE19731608C1
(en)
*
1997-07-23
1998-10-22
Vacutec Mestechnik Gmbh
Ionising chamber for radiometric measurements with high sensitivity
FI119204B
(en)
*
2001-12-18
2008-08-29
Oxford Instr Analytical Oy
Radiation detector, arrangement and method for measuring radioactive radiation, where continuous low-energy background noise has been reduced
Family Cites Families (2)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US3030512A
(en)
*
1958-11-21
1962-04-17
Gen Electric
Monochromator system
CH397883A
(en)
*
1963-03-01
1965-08-31
Foerderung Forschung Gmbh
Method for y compensation of an ionization chamber
1966
1966-09-08
GB
GB40108/66A
patent/GB1173155A/en
not_active
Expired
1966-09-27
DE
DE1966U0013115
patent/DE1564995B2/en
active
Granted
1966-12-16
US
US602355A
patent/US3514602A/en
not_active
Expired – Lifetime
Cited By (2)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
EP0475305A2
(en)
*
1990-09-10
1992-03-18
Shimadzu Corporation
Apparatus and method for inverse photoemission spectroscopy
EP0475305A3
(en)
*
1990-09-10
1992-10-21
Shimadzu Corporation
Apparatus and method for inverse photoemission spectroscopy
Also Published As
Publication number
Publication date
DE1564995B2
(en)
1976-11-18
US3514602A
(en)
1970-05-26
DE1564995A1
(en)
1970-01-15
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Legal Events
Date
Code
Title
Description
1970-04-15
PS
Patent sealed [section 19, patents act 1949]
1979-04-04
PCNP
Patent ceased through non-payment of renewal fee
