GB1355215A – Axial trajectory sensor for electronic particle study apparatus and method
– Google Patents
GB1355215A – Axial trajectory sensor for electronic particle study apparatus and method
– Google Patents
Axial trajectory sensor for electronic particle study apparatus and method
Info
Publication number
GB1355215A
GB1355215A
GB4943271A
GB4943271A
GB1355215A
GB 1355215 A
GB1355215 A
GB 1355215A
GB 4943271 A
GB4943271 A
GB 4943271A
GB 4943271 A
GB4943271 A
GB 4943271A
GB 1355215 A
GB1355215 A
GB 1355215A
Authority
GB
United Kingdom
Prior art keywords
pulse
graph
duration
circuit
pulses
Prior art date
1970-10-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4943271A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coulter Electronics Ltd
Coulter Electronics Inc
Original Assignee
Coulter Electronics Ltd
Coulter Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1970-10-27
Filing date
1971-10-25
Publication date
1974-06-05
1971-10-25
Application filed by Coulter Electronics Ltd, Coulter Electronics Inc
filed
Critical
Coulter Electronics Ltd
1974-06-05
Publication of GB1355215A
publication
Critical
patent/GB1355215A/en
Status
Expired
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
G01N15/10—Investigating individual particles
G01N15/12—Coulter-counters
G01N15/1209—Details
G01N15/1227—Circuits
Abstract
1355215 Particle analysis; pulse discrimiriating COULTER ELECTRONICS Ltd 25 Oct 1971 [27 Oct 1970 24 Dec 1970 8 Feb 1971 9 Feb 1971] 49432/71 Heading H3P [Also in Division G1] The invention relates to the analysis of pulses derived from a Coulter type particle-detector having a relatively long aperture. Desirable PULSES X (Figs. 2, 3) are produced by axial flow particles and they are SELECTED BY the fact that they have a SHORTER DURATION than undesirable pulses Y, Z, derived from particles which pass at an angle or close to the sides of the aperture and thereby pass through non-uniform regions of high current density. Additionally a “low” threshold circuit suppresses noise signals; the input circuit is blocked while a pulse is analysed, Fig. 7 (not shown), the output may be a rectangular pulse having the input pulse peak amplitude, or a delayed version of the original pulse Figs. 9, 10 (not shown); multiple peaks may be detected. Pulse width measurement. Figs. 4, 5.-Graph Fig. 5A shows a desirable pulse 30 and unwanted pulse 34. As is apparent from the circuit, Fig. 4, the pulses are applied (sequentially) to a stretcher 50 producing a “plateau” at peak amplitude X. This is reduced to half height by attenuator 58 and compared at 72 with the delayed original pulse graph C to produce a half-height-duration pulse graph D. This pulse is applied to integrator 72 to produce a ramp with maximum amplitude proportional to the pulse duration, graph F, and if this is less than the level 88, and more than the “noise” threshold 96, gate 144 is opened to pass on a portion of the stretched pulse (graph B) which appears as a rectangular pulse of set width and amplitude X, graph N. The width of this pulse is set by a “strobing” pulse (graph G) from a “one-shot” circuit 112 which is triggered by the trailing edge of the “half-height-duration” pulse graphs D and E; resetting pulses at the end of the cycle are generated similarly. The undesirable pulse 34 which gives rise to a signal 156 in excess of level 88 produces an output from comparator 92 to block the AND gate 120 so that an output pulse is not passed on. Modifications.-Fig. 6 (not shown) the pulse width signal may be provided by gating a clock oscillator instead of integrating as in graph 5F. Figs. 7 and 8 (not shown).-(i) a timing- sequence generator (208) is energized at the end of the “half-height-width” pulse to block further incoming signals until the measurement cycle is completed, (ii) the reference level is reset to the duration of the previous shortest pulse which is stored in a MINIMUM-DURATION-MEMORY-CIRCUIT. This circuit comprises an integrator 260 fed from a constant voltage source 262, so that the reference level drifts up slowly during processing to provide a slight tolerance, but is reset to each duration signal of a lesser level. Reference resetting circuit.-At time t 3 when the duration signal (graph E) has stopped increasing, “one-shot” 220 is triggered to operate AND-gate 240 which shunts a portion of the integrator to reduce the reference level (which is fed back on line 264) until it is equal to the duration signal on line 246. Comparator 248 then shuts the AND-gate 240, leaving the integrator reference level ready of the next measurement. Figs. 9, 10 the output is a delayed version of the input instead of a rectangular pulse. Fig. 11 finds the amplitude of the centre of the pulse, substantially as described in Specification 1,160,026. Figs. 13, 14. The position of the peak is found by differentiating the input pulse, graph 14B (not shown) and the peak amplitude at this position determines the output amplitude. The measuring technique for half-height-duration is substantially as before. Figs. 15, 16, double differentiation is used to detect pulses with multiple peaks which are rejected.
GB4943271A
1970-10-27
1971-10-25
Axial trajectory sensor for electronic particle study apparatus and method
Expired
GB1355215A
(en)
Applications Claiming Priority (4)
Application Number
Priority Date
Filing Date
Title
US8444070A
1970-10-27
1970-10-27
US10132570A
1970-12-24
1970-12-24
US11316571A
1971-02-08
1971-02-08
US11392071A
1971-02-09
1971-02-09
Publications (1)
Publication Number
Publication Date
GB1355215A
true
GB1355215A
(en)
1974-06-05
Family
ID=27491874
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
GB4943271A
Expired
GB1355215A
(en)
1970-10-27
1971-10-25
Axial trajectory sensor for electronic particle study apparatus and method
Country Status (5)
Country
Link
JP
(1)
JPS5426919B1
(en)
DE
(1)
DE2153123A1
(en)
FR
(1)
FR2110055A5
(en)
GB
(1)
GB1355215A
(en)
NL
(1)
NL7114609A
(en)
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
CN111404518A
(en)
*
2020-02-25
2020-07-10
成都天奥测控技术有限公司
Flexible and adjustable time delay comparison method and system
Families Citing this family (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US3890568A
(en)
*
1972-11-06
1975-06-17
Coulter Electronics
Method and apparatus for particle length measurement
Family Cites Families (2)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
DE2017513C3
(en)
*
1970-04-13
1975-07-10
Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen
Device for the digital representation of the shape of a measurement pulse, as well as device for the classification of electrical measurement pulses
DE2036366C3
(en)
*
1970-07-22
1974-01-17
Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen
Electrical circuit arrangement for evaluating signals that arise when particles pass through a measuring opening
1971
1971-10-25
GB
GB4943271A
patent/GB1355215A/en
not_active
Expired
1971-10-25
DE
DE19712153123
patent/DE2153123A1/en
not_active
Withdrawn
1971-10-25
FR
FR7138258A
patent/FR2110055A5/fr
not_active
Expired
1971-10-25
NL
NL7114609A
patent/NL7114609A/xx
not_active
Application Discontinuation
1971-10-25
JP
JP8508471A
patent/JPS5426919B1/ja
active
Pending
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
CN111404518A
(en)
*
2020-02-25
2020-07-10
成都天奥测控技术有限公司
Flexible and adjustable time delay comparison method and system
Also Published As
Publication number
Publication date
JPS5426919B1
(en)
1979-09-06
DE2153123A1
(en)
1972-05-10
NL7114609A
(en)
1972-05-02
FR2110055A5
(en)
1972-05-26
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Legal Events
Date
Code
Title
Description
1974-10-16
PS
Patent sealed
1991-11-27
PE20
Patent expired after termination of 20 years
