GB1461866A

GB1461866A – Measurement of optical properties of surfaces
– Google Patents

GB1461866A – Measurement of optical properties of surfaces
– Google Patents
Measurement of optical properties of surfaces

Info

Publication number
GB1461866A

GB1461866A
GB4146874A
GB4146874A
GB1461866A
GB 1461866 A
GB1461866 A
GB 1461866A
GB 4146874 A
GB4146874 A
GB 4146874A
GB 4146874 A
GB4146874 A
GB 4146874A
GB 1461866 A
GB1461866 A
GB 1461866A
Authority
GB
United Kingdom
Prior art keywords
retro
reflected
radiation
sept
measured
Prior art date
1974-09-24
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Expired

Application number
GB4146874A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Ross A R L

Original Assignee
Ross A R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1974-09-24
Filing date
1974-09-24
Publication date
1977-01-19

1974-09-24
Application filed by Ross A R L
filed
Critical
Ross A R L

1974-09-24
Priority to GB4146874A
priority
Critical
patent/GB1461866A/en

1977-01-19
Publication of GB1461866A
publication
Critical
patent/GB1461866A/en

Status
Expired
legal-status
Critical
Current

Links

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Global Dossier

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Classifications

G—PHYSICS

G01—MEASURING; TESTING

G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

G01B11/00—Measuring arrangements characterised by the use of optical techniques

G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

G—PHYSICS

G01—MEASURING; TESTING

G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated

G01N21/55—Specular reflectivity

G01N21/57—Measuring gloss

Abstract

1461866 Reflectometers A R L ROSS 18 Sept 1975 [24 Sept 1974] 41468/74 Heading G2J Surface roughness is measured by an optical system in which light from source e is reflected from a first test surface S on to a second test surface S (in Fig. 2, the two surfaces are identical) e.g. by the use of a retro-reflecting sheet R. The arrangement is such that translation and/or rotation of the surfaces S has substantially no effect on the positional and/or angular distribution of reflected radiation in the regions where it is measured. Roughness may be assessed according to:- (1) The spread of reflected radiation about the specular direction, (2) The variation in reflectivity with wavelength, or (3) the depolarisation of the radiation. In Fig. 3 (not shown) the retro-reflecting sheet R of Fig. 2 is replaced by a cube-corner reflector and in Fig. 4 (not shown) by an array of cubecorners. In Fig. 5 (not shown) the two test surfaces form a corner reflector. In Fig. 6 (not shown) a polarizer and an analyzer are added to the system of Fig. 2 while in Fig. 7 (not shown) an optical modulator is used to separate the retro-reflected signal from that due to diffusely reflected radiation.

GB4146874A
1974-09-24
1974-09-24
Measurement of optical properties of surfaces

Expired

GB1461866A
(en)

Priority Applications (1)

Application Number
Priority Date
Filing Date
Title

GB4146874A

GB1461866A
(en)

1974-09-24
1974-09-24
Measurement of optical properties of surfaces

Applications Claiming Priority (1)

Application Number
Priority Date
Filing Date
Title

GB4146874A

GB1461866A
(en)

1974-09-24
1974-09-24
Measurement of optical properties of surfaces

Publications (1)

Publication Number
Publication Date

GB1461866A
true

GB1461866A
(en)

1977-01-19

Family
ID=10419826
Family Applications (1)

Application Number
Title
Priority Date
Filing Date

GB4146874A
Expired

GB1461866A
(en)

1974-09-24
1974-09-24
Measurement of optical properties of surfaces

Country Status (1)

Country
Link

GB
(1)

GB1461866A
(en)

Cited By (6)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

EP0152894A2
(en)

*

1984-02-20
1985-08-28
Siemens Aktiengesellschaft
Device for optically detecting local inhomogeneities in the structure of tested objects

DE3427838A1
(en)

*

1984-07-27
1986-02-06
Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch

ROUGHNESS PROBE

DE3733041A1
(en)

*

1987-09-30
1989-04-13
Siemens Ag

TEST DEVICE FOR DETECTING SPATIAL IRREGULARITIES IN THE SURFACE STRUCTURE OF AN OBJECT

US5168322A
(en)

*

1991-08-19
1992-12-01
Diffracto Ltd.
Surface inspection using retro-reflective light field

US5206700A
(en)

*

1985-03-14
1993-04-27
Diffracto, Ltd.
Methods and apparatus for retroreflective surface inspection and distortion measurement

WO2004010094A1
(en)

*

2002-07-19
2004-01-29
Luxtron Corporation
Emissivity corrected radiation pyrometer integral with a reflectometer and roughness sensor for remote measuring of true surface temperatures

1974

1974-09-24
GB
GB4146874A
patent/GB1461866A/en
not_active
Expired

Cited By (7)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

EP0152894A2
(en)

*

1984-02-20
1985-08-28
Siemens Aktiengesellschaft
Device for optically detecting local inhomogeneities in the structure of tested objects

EP0152894A3
(en)

*

1984-02-20
1987-05-06
Siemens Aktiengesellschaft Berlin Und Munchen
Device for optically detecting local inhomogeneities in the structure of tested objects

DE3427838A1
(en)

*

1984-07-27
1986-02-06
Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch

ROUGHNESS PROBE

US5206700A
(en)

*

1985-03-14
1993-04-27
Diffracto, Ltd.
Methods and apparatus for retroreflective surface inspection and distortion measurement

DE3733041A1
(en)

*

1987-09-30
1989-04-13
Siemens Ag

TEST DEVICE FOR DETECTING SPATIAL IRREGULARITIES IN THE SURFACE STRUCTURE OF AN OBJECT

US5168322A
(en)

*

1991-08-19
1992-12-01
Diffracto Ltd.
Surface inspection using retro-reflective light field

WO2004010094A1
(en)

*

2002-07-19
2004-01-29
Luxtron Corporation
Emissivity corrected radiation pyrometer integral with a reflectometer and roughness sensor for remote measuring of true surface temperatures

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Legal Events

Date
Code
Title
Description

1977-07-20
PS
Patent sealed

1980-04-23
PCNP
Patent ceased through non-payment of renewal fee

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