GB2010497B – In-situ test and diagnostic circuitry and method for cml chips
– Google Patents
GB2010497B – In-situ test and diagnostic circuitry and method for cml chips
– Google Patents
In-situ test and diagnostic circuitry and method for cml chips
Info
Publication number
GB2010497B
GB2010497B
GB7845902A
GB7845902A
GB2010497B
GB 2010497 B
GB2010497 B
GB 2010497B
GB 7845902 A
GB7845902 A
GB 7845902A
GB 7845902 A
GB7845902 A
GB 7845902A
GB 2010497 B
GB2010497 B
GB 2010497B
Authority
GB
United Kingdom
Prior art keywords
chip
cml
circuit
test
diagnostic
Prior art date
1977-12-23
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB7845902A
Other versions
GB2010497A
(en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Unisys Corp
Original Assignee
Burroughs Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1977-12-23
Filing date
1978-11-24
Publication date
1982-06-30
1978-11-24
Application filed by Burroughs Corp
filed
Critical
Burroughs Corp
1979-06-27
Publication of GB2010497A
publication
Critical
patent/GB2010497A/en
1982-06-30
Application granted
granted
Critical
1982-06-30
Publication of GB2010497B
publication
Critical
patent/GB2010497B/en
Status
Expired
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/28—Testing of electronic circuits, e.g. by signal tracer
G01R31/317—Testing of digital circuits
G01R31/3181—Functional testing
G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/28—Testing of electronic circuits, e.g. by signal tracer
G01R31/30—Marginal testing, e.g. by varying supply voltage
G01R31/3004—Current or voltage test
G—PHYSICS
G06—COMPUTING; CALCULATING OR COUNTING
G06F—ELECTRIC DIGITAL DATA PROCESSING
G06F11/00—Error detection; Error correction; Monitoring
G06F11/006—Identification
G—PHYSICS
G06—COMPUTING; CALCULATING OR COUNTING
G06F—ELECTRIC DIGITAL DATA PROCESSING
G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
G06F2201/83—Indexing scheme relating to error detection, to error correction, and to monitoring the solution involving signatures
Abstract
An In-Situ Test and Diagnostic Circuit and Method to monitor the integrity of external connections of a current mode logic integrated circuit chip (inputs and outputs) as well as the integrity of the logic function thereof. The circuit comprises three parts: an “Open” Input Detector to detect open connections or connections that are becoming open between one chip and another; an Output Short Detector to monitor shorts at any chip output; and a Signature Test and Diagnostic circuit to determine if the logic function of the chip itself is operational. All the foregoing circuit parts are formed as an integral part of each CML chip and connected to an output terminal called a Test and Diagnostic Pin.
GB7845902A
1977-12-23
1978-11-24
In-situ test and diagnostic circuitry and method for cml chips
Expired
GB2010497B
(en)
Applications Claiming Priority (1)
Application Number
Priority Date
Filing Date
Title
US05/863,696
US4183460A
(en)
1977-12-23
1977-12-23
In-situ test and diagnostic circuitry and method for CML chips
Publications (2)
Publication Number
Publication Date
GB2010497A
GB2010497A
(en)
1979-06-27
GB2010497B
true
GB2010497B
(en)
1982-06-30
Family
ID=25341594
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
GB7845902A
Expired
GB2010497B
(en)
1977-12-23
1978-11-24
In-situ test and diagnostic circuitry and method for cml chips
Country Status (12)
Country
Link
US
(1)
US4183460A
(en)
JP
(1)
JPS5492069A
(en)
BR
(1)
BR7808233A
(en)
DE
(1)
DE2854549A1
(en)
FR
(1)
FR2412848A1
(en)
GB
(1)
GB2010497B
(en)
IN
(1)
IN150900B
(en)
IT
(1)
IT1100622B
(en)
NL
(1)
NL182025C
(en)
PL
(1)
PL211560A1
(en)
SE
(1)
SE433671B
(en)
YU
(1)
YU287178A
(en)
Families Citing this family (25)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
DE2905294A1
(en)
*
1979-02-12
1980-08-21
Philips Patentverwaltung
INTEGRATED CIRCUIT ARRANGEMENT IN MOS TECHNOLOGY WITH FIELD EFFECT TRANSISTORS
DE2905271A1
(en)
*
1979-02-12
1980-08-21
Philips Patentverwaltung
INTEGRATED CIRCUIT ARRANGEMENT IN MOS TECHNOLOGY WITH FIELD EFFECT TRANSISTORS
US4479088A
(en)
*
1981-01-16
1984-10-23
Burroughs Corporation
Wafer including test lead connected to ground for testing networks thereon
US4395767A
(en)
*
1981-04-20
1983-07-26
Control Data Corporation
Interconnect fault detector for LSI logic chips
US4504784A
(en)
*
1981-07-02
1985-03-12
International Business Machines Corporation
Method of electrically testing a packaging structure having N interconnected integrated circuit chips
US4441075A
(en)
*
1981-07-02
1984-04-03
International Business Machines Corporation
Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4494066A
(en)
*
1981-07-02
1985-01-15
International Business Machines Corporation
Method of electrically testing a packaging structure having n interconnected integrated circuit chips
US4509008A
(en)
*
1982-04-20
1985-04-02
International Business Machines Corporation
Method of concurrently testing each of a plurality of interconnected integrated circuit chips
US4638246A
(en)
*
1984-09-21
1987-01-20
Gte Laboratories Incorporated
Integrated circuit input-output diagnostic system
US4656417A
(en)
*
1985-07-29
1987-04-07
International Business Machines Corporation
Test circuit for differential cascode voltage switch
US5051996A
(en)
*
1989-03-27
1991-09-24
The United States Of America As Represented By The United States Department Of Energy
Built-in-test by signature inspection (bitsi)
US5289113A
(en)
*
1989-08-01
1994-02-22
Analog Devices, Inc.
PROM for integrated circuit identification and testing
US5377124A
(en)
*
1989-09-20
1994-12-27
Aptix Corporation
Field programmable printed circuit board
EP0481703B1
(en)
*
1990-10-15
2003-09-17
Aptix Corporation
Interconnect substrate having integrated circuit for programmable interconnection and sample testing
US5440230A
(en)
*
1993-04-02
1995-08-08
Heflinger; Bruce L.
Combinatorial signature for component identification
KR100382063B1
(en)
*
1996-08-21
2003-06-18
삼성에스디아이 주식회사
Apparatus of measuring in-situ conductivity for deterioration evaluation of active material
US7437638B2
(en)
*
2002-11-12
2008-10-14
Agilent Technologies, Inc.
Boundary-Scan methods and apparatus
US7447964B2
(en)
*
2005-01-03
2008-11-04
International Business Machines Corporation
Difference signal path test and characterization circuit
KR100690275B1
(en)
*
2006-01-31
2007-03-12
삼성전자주식회사
Current-mode semiconductor integrated circuit device for operating in voltage mode during test mode
EP2039248A1
(en)
*
2007-09-21
2009-03-25
Bayer CropScience AG
Active agent combinations with insecticide and acaricide properties
JP5476876B2
(en)
*
2009-09-11
2014-04-23
株式会社リコー
Sensor driving circuit, driver device, image reading device, and image forming device
CN104732947B
(en)
*
2015-04-16
2017-02-22
京东方科技集团股份有限公司
Driving chip, driving board and method for testing same, and display device
US10473711B2
(en)
*
2016-04-15
2019-11-12
Infineon Technologies Ag
Multi-channel fault detection with a single diagnosis output
CN106569118B
(en)
*
2016-10-08
2019-09-10
芯海科技（深圳）股份有限公司
A kind of chip short-circuit failure detection system and method
CN108226749A
(en)
*
2017-12-11
2018-06-29
天津津航计算技术研究所
A kind of SIP failure of chip detecting system and detection method
Family Cites Families (12)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US3582633A
(en)
*
1968-02-20
1971-06-01
Lockheed Aircraft Corp
Method and apparatus for fault detection in a logic circuit
NL7005372A
(en)
*
1970-04-15
1971-10-19
US3815025A
(en)
*
1971-10-18
1974-06-04
Ibm
Large-scale integrated circuit testing structure
BE790243A
(en)
*
1971-11-08
1973-02-15
Burroughs Corp
METHOD AND APPARATUS FOR VERIFYING SUB-SYSTEMS OF BINARY CIRCUITS
JPS5213915B2
(en)
*
1972-02-14
1977-04-18
US3792349A
(en)
*
1972-10-25
1974-02-12
Honeywell Inf Systems
Dual channel, dual potential open-circuit test apparatus
FR2330014A1
(en)
*
1973-05-11
1977-05-27
Ibm France
BLOCK TEST PROCEDURE OF INTEGRATED LOGIC CIRCUITS AND BLOCKS BY APPLYING
US3924181A
(en)
*
1973-10-16
1975-12-02
Hughes Aircraft Co
Test circuitry employing a cyclic code generator
US3976864A
(en)
*
1974-09-03
1976-08-24
Hewlett-Packard Company
Apparatus and method for testing digital circuits
US3919533A
(en)
*
1974-11-08
1975-11-11
Westinghouse Electric Corp
Electrical fault indicator
US4009437A
(en)
*
1976-03-31
1977-02-22
Burroughs Corporation
Net analyzer for electronic circuits
US4055802A
(en)
*
1976-08-12
1977-10-25
Bell Telephone Laboratories, Incorporated
Electrical identification of multiply configurable circuit array
1977
1977-12-23
US
US05/863,696
patent/US4183460A/en
not_active
Expired – Lifetime
1978
1978-11-21
IN
IN1258/CAL/78A
patent/IN150900B/en
unknown
1978-11-24
GB
GB7845902A
patent/GB2010497B/en
not_active
Expired
1978-12-05
SE
SE7812490A
patent/SE433671B/en
not_active
IP Right Cessation
1978-12-06
IT
IT30659/78A
patent/IT1100622B/en
active
1978-12-07
YU
YU02871/78A
patent/YU287178A/en
unknown
1978-12-08
FR
FR7834696A
patent/FR2412848A1/en
active
Granted
1978-12-08
PL
PL21156078A
patent/PL211560A1/en
unknown
1978-12-08
JP
JP15259678A
patent/JPS5492069A/en
active
Granted
1978-12-14
BR
BR7808233A
patent/BR7808233A/en
unknown
1978-12-18
DE
DE19782854549
patent/DE2854549A1/en
active
Granted
1978-12-20
NL
NLAANVRAGE7812362,A
patent/NL182025C/en
not_active
IP Right Cessation
Also Published As
Publication number
Publication date
IT1100622B
(en)
1985-09-28
NL182025B
(en)
1987-07-16
FR2412848A1
(en)
1979-07-20
YU287178A
(en)
1982-10-31
FR2412848B1
(en)
1983-03-18
GB2010497A
(en)
1979-06-27
NL7812362A
(en)
1979-06-26
IT7830659D0
(en)
1978-12-06
BR7808233A
(en)
1979-08-14
JPS6321154B2
(en)
1988-05-02
JPS5492069A
(en)
1979-07-20
US4183460A
(en)
1980-01-15
IN150900B
(en)
1983-01-08
PL211560A1
(en)
1979-08-27
SE7812490L
(en)
1979-06-24
DE2854549A1
(en)
1979-06-28
DE2854549C2
(en)
1987-06-11
NL182025C
(en)
1987-12-16
SE433671B
(en)
1984-06-04
Similar Documents
Publication
Publication Date
Title
GB2010497B
(en)
1982-06-30
In-situ test and diagnostic circuitry and method for cml chips
JPS57180140A
(en)
1982-11-06
Mutual connecting defect detector for logic circuit
DE3171811D1
(en)
1985-09-19
Apparatus for the dynamic in-circuit testing of electronic digital circuit elements
JPH0394183A
(en)
1991-04-18
Testing method for semiconductor integrated circuit and circuit therefor
JPS6170475A
(en)
1986-04-11
Input/output common circuit for integrating circuit
WO1999056396A3
(en)
2000-01-06
Testable ic having analog and digital circuits
JPH0474977A
(en)
1992-03-10
Semiconductor integrated circuit
JPH03137581A
(en)
1991-06-12
Semiconductor integrated circuit
JPH01111365A
(en)
1989-04-28
Semiconductor integrated circuit
JPS5745942A
(en)
1982-03-16
Semiconductor integrated circuit device
JPS6443773A
(en)
1989-02-16
Propagation delay testing method for logic circuit
JPH042000A
(en)
1992-01-07
Semiconductor integrated circuit provided with ram test mode
JPH03237376A
(en)
1991-10-23
Semiconductor integrated circuit
KR940006067Y1
(en)
1994-09-08
Input dc current testing circuit
JPH04336442A
(en)
1992-11-24
Semiconductor ic
KR930003179Y1
(en)
1993-05-31
Kr/ circuit for testing dc output
JPH04157747A
(en)
1992-05-29
Semiconductor integrated circuit with a built-in circuit for testing bonding of lead wire
ATE111609T1
(en)
1994-09-15
ARRANGEMENT FOR TESTING DIGITAL CIRCUITS WITH CONFIGURABLE CLOCK GENERATION CIRCUITS INCLUDED IN THE TEST.
JPH03242572A
(en)
1991-10-29
Semiconductor integrated circuit
JPH0429075A
(en)
1992-01-31
Semiconductor integrated circuit device
JPS5466778A
(en)
1979-05-29
Ic board
JPH04265874A
(en)
1992-09-22
Test circuit for lsi
JPS60174963A
(en)
1985-09-09
Electronic package testing circuit
JPS61149866A
(en)
1986-07-08
Semiconductor integrated circuit
JPS6413758A
(en)
1989-01-18
Integrated circuit device
Legal Events
Date
Code
Title
Description
1985-12-24
732
Registration of transactions, instruments or events in the register (sect. 32/1977)
1997-07-16
PCNP
Patent ceased through non-payment of renewal fee
Effective date:
19961124
