GB1041436A – Improvements in or relating to surface measuring devices
– Google Patents
GB1041436A – Improvements in or relating to surface measuring devices
– Google Patents
Improvements in or relating to surface measuring devices
Info
Publication number
GB1041436A
GB1041436A
GB15399/64A
GB1539964A
GB1041436A
GB 1041436 A
GB1041436 A
GB 1041436A
GB 15399/64 A
GB15399/64 A
GB 15399/64A
GB 1539964 A
GB1539964 A
GB 1539964A
GB 1041436 A
GB1041436 A
GB 1041436A
Authority
GB
United Kingdom
Prior art keywords
plate
light
april
workpiece
shows
Prior art date
1963-04-22
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB15399/64A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SPEEDLAP SUPPLY CORP
Original Assignee
SPEEDLAP SUPPLY CORP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1963-04-22
Filing date
1964-04-14
Publication date
1966-09-07
1964-04-14
Application filed by SPEEDLAP SUPPLY CORP
filed
Critical
SPEEDLAP SUPPLY CORP
1966-09-07
Publication of GB1041436A
publication
Critical
patent/GB1041436A/en
Status
Expired
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
G—PHYSICS
G01—MEASURING; TESTING
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00—Measuring arrangements characterised by the use of optical techniques
G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
G—PHYSICS
G01—MEASURING; TESTING
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
G01B21/06—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness specially adapted for measuring length or width of objects while moving
G01B21/065—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness specially adapted for measuring length or width of objects while moving for stretchable materials
Abstract
1,041,436. Optical apparatus. SPEEDLAP SUPPLY CORPORATION. April 14,1964 [April 22, 1963], No. 15399/64. Heading G2J. [Also in Division G1] In a device for checking the surface flatness of a workpiece S, light from a source 50 passes through a collimating lens 52 to impinge on the undersurface of a plate 38 formed with a diffraction grating 46, on which is laid the workpiece S. The diffracted light is reflected by a mirror 68 towards an observation window 78. The light in the device passes through apertured baffles 60, 64. Typical diffraction patterns are shown in Figs. 6 and 9 (not shown), where Fig. 6 shows the typical pattern obtained with a flat surface, whereas Fig. 9 shows the pattern of an indented surface. Plate 38 is movably mounted in the aperture of cover plate 14 and may be tilted by gear actuated means. Markers are provided to indicate possible plate settings, the various angles of tilt increasing and decreasing the apparent time spacing of the grating.
GB15399/64A
1963-04-22
1964-04-14
Improvements in or relating to surface measuring devices
Expired
GB1041436A
(en)
Applications Claiming Priority (1)
Application Number
Priority Date
Filing Date
Title
US274627A
US3314328A
(en)
1963-04-22
1963-04-22
Surface measuring device
Publications (1)
Publication Number
Publication Date
GB1041436A
true
GB1041436A
(en)
1966-09-07
Family
ID=23048989
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
GB15399/64A
Expired
GB1041436A
(en)
1963-04-22
1964-04-14
Improvements in or relating to surface measuring devices
Country Status (3)
Country
Link
US
(1)
US3314328A
(en)
CH
(1)
CH424284A
(en)
GB
(1)
GB1041436A
(en)
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
FR2493541A1
(en)
*
1980-11-04
1982-05-07
Israel Atomic Energy Comm
METHOD AND EQUIPMENT FOR ANALYZING RADIATION DEVIATION
Families Citing this family (8)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US3473877A
(en)
*
1965-12-10
1969-10-21
Cluett Peabody & Co Inc
Instrument for evaluating crease performance in flexible materials
US3609044A
(en)
*
1969-07-01
1971-09-28
Eastman Kodak Co
Apparatus for selectively inspecting a web surface and a coating on the surface
US3814521A
(en)
*
1972-09-12
1974-06-04
Hoffmann La Roche
Object recognition
US5471307A
(en)
*
1992-09-21
1995-11-28
Phase Shift Technology, Inc.
Sheet flatness measurement system and method
US5686987A
(en)
1995-12-29
1997-11-11
Orfield Associates, Inc.
Methods for assessing visual tasks to establish desirable lighting and viewing conditions for performance of tasks; apparatus; and, applications
GB9616943D0
(en)
*
1996-08-13
1996-09-25
Intellectual Property Holding
Flatness investigation
US7327473B2
(en)
*
2005-11-23
2008-02-05
General Electric Company
Flatness tester for optical components
US10274311B2
(en)
2016-10-19
2019-04-30
Columbia Insurance Company
Three dimensional laser measurement device for quality control measurements
Family Cites Families (7)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US3124638A
(en)
*
1964-03-10
Apparatus for the orientation of crystals
US1552451A
(en)
*
1922-07-22
1925-09-08
Harry F Roach
Optical instrument
US1988556A
(en)
*
1934-02-28
1935-01-22
Henry A Gardner
Gloss measuring device
US2253054A
(en)
*
1939-09-13
1941-08-19
Eastman Kodak Co
Device for measuring flatness of glass
US2867149A
(en)
*
1953-10-05
1959-01-06
Bell Telephone Labor Inc
Method of determining surface flatness
US2857798A
(en)
*
1954-07-16
1958-10-28
Sperry Rand Corp
Automatic optical drift angle indicator
US2902898A
(en)
*
1954-07-28
1959-09-08
Gen Dynamics Corp
Optical inspection device for transparent sheet material
1963
1963-04-22
US
US274627A
patent/US3314328A/en
not_active
Expired – Lifetime
1964
1964-04-14
GB
GB15399/64A
patent/GB1041436A/en
not_active
Expired
1964-04-17
CH
CH495164A
patent/CH424284A/en
unknown
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
FR2493541A1
(en)
*
1980-11-04
1982-05-07
Israel Atomic Energy Comm
METHOD AND EQUIPMENT FOR ANALYZING RADIATION DEVIATION
Also Published As
Publication number
Publication date
CH424284A
(en)
1966-11-15
US3314328A
(en)
1967-04-18
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