GB1087219A – An x-ray diffraction goniometer
– Google Patents
GB1087219A – An x-ray diffraction goniometer
– Google Patents
An x-ray diffraction goniometer
Info
Publication number
GB1087219A
GB1087219A
GB3317766A
GB3317766A
GB1087219A
GB 1087219 A
GB1087219 A
GB 1087219A
GB 3317766 A
GB3317766 A
GB 3317766A
GB 3317766 A
GB3317766 A
GB 3317766A
GB 1087219 A
GB1087219 A
GB 1087219A
Authority
GB
United Kingdom
Prior art keywords
slit
sample
support
detector
shaft
Prior art date
1965-07-22
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3317766A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1965-07-22
Filing date
1966-07-22
Publication date
1967-10-18
1966-07-22
Application filed by Jeol Ltd, Nihon Denshi KK
filed
Critical
Jeol Ltd
1967-10-18
Publication of GB1087219A
publication
Critical
patent/GB1087219A/en
Status
Expired
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
G01N23/20025—Sample holders or supports therefor
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Abstract
1,087,219. X-ray goniometer-slit adjusting means. NIHON DENSHI KABUSHIKI KAISHA. July 22, 1966 [July 22, 1965], No. 33177/66. Heading H5R. In an X-ray goniometer which comprises a rotatable support for a sample, a slit through which X-rays are directed on to the sample and a detector for recording diffracted rays, control means are provided to adjust the width of the slit, said control means being coupled to the rotatable support so that on varying the glancing angle of the incident radiation on the sample by rotating the support, the divergence of the incident beam is automatically altered by the adjustment of the slit so that a substantially constant area of the sample is irradiated. Preferably, the slit width is directly proportional to the glancing angle. The slit control means preferably comprises a shaft 30 being threaded from each end with a right-hand and a left-hand thread respectively. The straight edges defining the slit 4a, 4b are appropriately mounted so that the slit is widened or narrowed according to the direction of rotation of the shaft. The slit arrangement and shaft are mounted on an arm 25 relative to which the sample support 9 is rotatable. The shaft is connected by gearing and spindle 24 to pin 23 which co-operates with quadrant gear 22 mounted on the arm 8 carrying detector 6 for the diffracted radiation. Preferably, the sample support 9 and the detector arm 8 are so coupled that a rotation of #in the support 9 corresponds to a rotation 20 in detector arm 8. All the various components are rotatable by the assemblage of gears and worms numbered 10-14 either by motor (not shown) through worm 14 or by turn wheels 15, 16. These gears may be disengaged to assist manual adjustment of the sample settings. Rings 17, 18, 19 and 20 between gears 10 and 13 are used for adjusting the angle of the detector.
GB3317766A
1965-07-22
1966-07-22
An x-ray diffraction goniometer
Expired
GB1087219A
(en)
Applications Claiming Priority (1)
Application Number
Priority Date
Filing Date
Title
JP6017065
1965-07-22
Publications (1)
Publication Number
Publication Date
GB1087219A
true
GB1087219A
(en)
1967-10-18
Family
ID=13134406
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
GB3317766A
Expired
GB1087219A
(en)
1965-07-22
1966-07-22
An x-ray diffraction goniometer
Country Status (2)
Country
Link
DE
(1)
DE1497531A1
(en)
GB
(1)
GB1087219A
(en)
Cited By (2)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
JPS5063982A
(en)
*
1973-07-25
1975-05-30
GB2521908A
(en)
*
2013-11-25
2015-07-08
Rigaku Denki Co Ltd
Optical axis adjustment method for x-ray analyzer and x-ray analyzer
Families Citing this family (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
JPS5744841A
(en)
*
1980-09-01
1982-03-13
Hitachi Ltd
Method and apparatus for x-ray diffraction
1966
1966-07-12
DE
DE19661497531
patent/DE1497531A1/en
active
Pending
1966-07-22
GB
GB3317766A
patent/GB1087219A/en
not_active
Expired
Cited By (3)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
JPS5063982A
(en)
*
1973-07-25
1975-05-30
JPS5328222B2
(en)
*
1973-07-25
1978-08-12
GB2521908A
(en)
*
2013-11-25
2015-07-08
Rigaku Denki Co Ltd
Optical axis adjustment method for x-ray analyzer and x-ray analyzer
Also Published As
Publication number
Publication date
DE1497531A1
(en)
1969-03-27
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