GB1094862A

GB1094862A – Improvements in and relating to strain gauges
– Google Patents

GB1094862A – Improvements in and relating to strain gauges
– Google Patents
Improvements in and relating to strain gauges

Info

Publication number
GB1094862A

GB1094862A
GB1333364A
GB1333364A
GB1094862A
GB 1094862 A
GB1094862 A
GB 1094862A
GB 1333364 A
GB1333364 A
GB 1333364A
GB 1333364 A
GB1333364 A
GB 1333364A
GB 1094862 A
GB1094862 A
GB 1094862A
Authority
GB
United Kingdom
Prior art keywords
diaphragm
strain
elements
transducer
transverse
Prior art date
1964-03-31
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Expired

Application number
GB1333364A
Inventor
Frank Cox
Victor Frederick George Tull
Frederick Edwa Rd Duffield
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Ether Engineering Ltd

Original Assignee
Ether Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1964-03-31
Filing date
1964-03-31
Publication date
1967-12-13

1964-03-31
Application filed by Ether Engineering Ltd
filed
Critical
Ether Engineering Ltd

1964-03-31
Priority to GB1333364A
priority
Critical
patent/GB1094862A/en

1967-12-13
Publication of GB1094862A
publication
Critical
patent/GB1094862A/en

Status
Expired
legal-status
Critical
Current

Links

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Global Dossier

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Classifications

G—PHYSICS

G01—MEASURING; TESTING

G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE

G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means

G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms

G01L9/0051—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance

G01L9/0052—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements

G01L9/0054—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements integral with a semiconducting diaphragm

Abstract

1,094,862. Semi-conductor strain gauges. ETHER ENGINEERING Ltd. March 29, 1965 [March 31, 1964], No. 13333/64. Heading H1K. [Also in Division G1] A transducer has a plurality of elongate piezo-resistive semi-conductor elements formed integrally with an edge-clamped circular diaphragm at one of its faces, and is so designed that substantially no adverse interaction occurs between the response of each element to transverse and longitudinal strain. This is achieved either by so orientating an element relative to the crystal structure that the response to transverse strain is much less than that to longitudinal strain (or vice versa) or by positioning the element on the diaphragm in a region where it will be strained in only one of the transverse and longitudinal directions. The diaphragm is made of a monocrystalline semi-conductor such as silicon and the elements are formed by localized diffusion or epitaxial growth. The embodiments illustrated (not shown) each have four active elements which in operation are used as the four arms of a bridge. The transducer is used to measure the differential pressure between the two sides of its diaphragm. Because of the clamping there will be little tangential strain at the periphery of the diaphragm and the diaphragm will have a double curvature under the impressed load resulting in the presence of a neutral circle at which the radial strain is zero. The position, orientation relative to the crystal axes, and conductivity type of the elements are chosen bearing in mind these facts. It is stated that the transducer may have only two elements (responding in opposite senses) which are connected in a half-bridge arrangement.

GB1333364A
1964-03-31
1964-03-31
Improvements in and relating to strain gauges

Expired

GB1094862A
(en)

Priority Applications (1)

Application Number
Priority Date
Filing Date
Title

GB1333364A

GB1094862A
(en)

1964-03-31
1964-03-31
Improvements in and relating to strain gauges

Applications Claiming Priority (1)

Application Number
Priority Date
Filing Date
Title

GB1333364A

GB1094862A
(en)

1964-03-31
1964-03-31
Improvements in and relating to strain gauges

Publications (1)

Publication Number
Publication Date

GB1094862A
true

GB1094862A
(en)

1967-12-13

Family
ID=10021030
Family Applications (1)

Application Number
Title
Priority Date
Filing Date

GB1333364A
Expired

GB1094862A
(en)

1964-03-31
1964-03-31
Improvements in and relating to strain gauges

Country Status (1)

Country
Link

GB
(1)

GB1094862A
(en)

Cited By (4)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

US3662312A
(en)

*

1968-03-23
1972-05-09
Ferranti Ltd
Semiconductor strain transducers

GB2000639A
(en)

*

1977-06-29
1979-01-10
Tokyo Shibaura Electric Co
Semiconductor device

WO2006016136A3
(en)

*

2004-08-10
2006-07-27
Dage Prec Ind Ltd
Shear test device

US7905152B2
(en)

2006-02-17
2011-03-15
Nordson Corporation
Shear test apparatus and method

1964

1964-03-31
GB
GB1333364A
patent/GB1094862A/en
not_active
Expired

Cited By (7)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

US3662312A
(en)

*

1968-03-23
1972-05-09
Ferranti Ltd
Semiconductor strain transducers

GB2000639A
(en)

*

1977-06-29
1979-01-10
Tokyo Shibaura Electric Co
Semiconductor device

GB2000639B
(en)

*

1977-06-29
1982-03-31
Tokyo Shibaura Electric Co
Semiconductor device

WO2006016136A3
(en)

*

2004-08-10
2006-07-27
Dage Prec Ind Ltd
Shear test device

US7730790B2
(en)

2004-08-10
2010-06-08
Nordson Corporation
Shear test device

US7997147B2
(en)

2004-08-10
2011-08-16
Nordson Corporation
Shear test device

US7905152B2
(en)

2006-02-17
2011-03-15
Nordson Corporation
Shear test apparatus and method

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