GB1310868A

GB1310868A – Semiconductor device
– Google Patents

GB1310868A – Semiconductor device
– Google Patents
Semiconductor device

Info

Publication number
GB1310868A

GB1310868A
GB4166071A
GB4166071A
GB1310868A
GB 1310868 A
GB1310868 A
GB 1310868A
GB 4166071 A
GB4166071 A
GB 4166071A
GB 4166071 A
GB4166071 A
GB 4166071A
GB 1310868 A
GB1310868 A
GB 1310868A
Authority
GB
United Kingdom
Prior art keywords
thick
regions
electrodes
insulation
thin
Prior art date
1970-09-29
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Expired

Application number
GB4166071A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

NCR Voyix Corp

National Cash Register Co

Original Assignee
NCR Corp
National Cash Register Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1970-09-29
Filing date
1971-09-07
Publication date
1973-03-21

1971-09-07
Application filed by NCR Corp, National Cash Register Co
filed
Critical
NCR Corp

1973-03-21
Publication of GB1310868A
publication
Critical
patent/GB1310868A/en

Status
Expired
legal-status
Critical
Current

Links

Espacenet

Global Dossier

Discuss

Classifications

H—ELECTRICITY

H01—ELECTRIC ELEMENTS

H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10

H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor

H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched

H01L29/76—Unipolar devices, e.g. field effect transistors

H01L29/762—Charge transfer devices

H01L29/765—Charge-coupled devices

H01L29/768—Charge-coupled devices with field effect produced by an insulated gate

H01L29/76866—Surface Channel CCD

H01L29/76875—Two-Phase CCD

H—ELECTRICITY

H01—ELECTRIC ELEMENTS

H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10

H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

H01L29/40—Electrodes ; Multistep manufacturing processes therefor

H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions

H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched

H01L29/42312—Gate electrodes for field effect devices

H01L29/42396—Gate electrodes for field effect devices for charge coupled devices

Abstract

1310868 Semi-conductor devices NATIONAL CASH REGISTER CO 7 Sept 1971 [29 Sept 1970] 41660/71 Heading H1K A charge coupled device consists of a semiductor substrate and a layer of insulation on one face having a series of alternately thick and thin regions between minority carrier injection and detection locations. The transfer electrodes, each consisting of a metal layer overlying adjacent thick and thin regions form two alternating groups supplied with oppositely phased pulse waveforms. As shown, Fig. 1, the series of regions is disposed within an etched channel in a much thicker layer 14 of silica, on which the conductive connections to the electrodes are located. The minority carrier injection may be effected, as shown, by an avalanche device consisting of a metal layer on thin insulation 35, by an electron beam, or by a PN or Schottky barrier on the N-type silicon substrate. Transferred minority carriers can also be detected by such a barrier. The thin regions under the transfer electrodes may be 800-1000 Š thick and the thick regions 100-500 Š thicker. In operation the pulses applied to the two groups of electrodes are of the same magnitude. Backward movement of the carriers is avoided because on account of the greater thickness of insulation the potential well beneath the leading edge of each transfer electrode is always shallower than that at the trailing edge.

GB4166071A
1970-09-29
1971-09-07
Semiconductor device

Expired

GB1310868A
(en)

Applications Claiming Priority (1)

Application Number
Priority Date
Filing Date
Title

US7645370A

1970-09-29
1970-09-29

Publications (1)

Publication Number
Publication Date

GB1310868A
true

GB1310868A
(en)

1973-03-21

Family
ID=22132121
Family Applications (1)

Application Number
Title
Priority Date
Filing Date

GB4166071A
Expired

GB1310868A
(en)

1970-09-29
1971-09-07
Semiconductor device

Country Status (9)

Country
Link

AU
(1)

AU464863B2
(en)

BE
(1)

BE773210A
(en)

CH
(1)

CH539922A
(en)

DE
(1)

DE2146891A1
(en)

ES
(1)

ES395374A1
(en)

FR
(1)

FR2108053B1
(en)

GB
(1)

GB1310868A
(en)

NL
(1)

NL7113199A
(en)

ZA
(1)

ZA715975B
(en)

Cited By (1)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

GB2190540A
(en)

*

1986-05-13
1987-11-18
Mitsubishi Electric Corp
Solid state image sensor

1971

1971-09-07
GB
GB4166071A
patent/GB1310868A/en
not_active
Expired

1971-09-07
ZA
ZA715975A
patent/ZA715975B/en
unknown

1971-09-13
AU
AU33375/71A
patent/AU464863B2/en
not_active
Expired

1971-09-17
CH
CH1358271A
patent/CH539922A/en
not_active
IP Right Cessation

1971-09-20
DE
DE19712146891
patent/DE2146891A1/en
active
Pending

1971-09-23
ES
ES395374A
patent/ES395374A1/en
not_active
Expired

1971-09-24
NL
NL7113199A
patent/NL7113199A/xx
unknown

1971-09-27
FR
FR7134590A
patent/FR2108053B1/fr
not_active
Expired

1971-09-28
BE
BE773210A
patent/BE773210A/en
unknown

Cited By (3)

* Cited by examiner, † Cited by third party

Publication number
Priority date
Publication date
Assignee
Title

GB2190540A
(en)

*

1986-05-13
1987-11-18
Mitsubishi Electric Corp
Solid state image sensor

US4760273A
(en)

*

1986-05-13
1988-07-26
Mitsubishi Denki Kabushiki Kaisha
Solid-state image sensor with groove-situated transfer elements

GB2190540B
(en)

*

1986-05-13
1990-02-21
Mitsubishi Electric Corp
Solid-state image sensor

Also Published As

Publication number
Publication date

DE2146891A1
(en)

1972-04-06

NL7113199A
(en)

1972-04-04

BE773210A
(en)

1972-01-17

FR2108053A1
(en)

1972-05-12

CH539922A
(en)

1973-07-31

FR2108053B1
(en)

1977-10-21

AU3337571A
(en)

1973-03-22

AU464863B2
(en)

1975-09-11

ES395374A1
(en)

1975-06-16

ZA715975B
(en)

1972-05-31

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Legal Events

Date
Code
Title
Description

1973-08-01
PS
Patent sealed

1977-04-06
PLNP
Patent lapsed through nonpayment of renewal fees

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