GB1402110A – X-ray spectrometer apparatus
– Google Patents
GB1402110A – X-ray spectrometer apparatus
– Google Patents
X-ray spectrometer apparatus
Info
Publication number
GB1402110A
GB1402110A
GB4606972A
GB4606972A
GB1402110A
GB 1402110 A
GB1402110 A
GB 1402110A
GB 4606972 A
GB4606972 A
GB 4606972A
GB 4606972 A
GB4606972 A
GB 4606972A
GB 1402110 A
GB1402110 A
GB 1402110A
Authority
GB
United Kingdom
Prior art keywords
channel
crystal
specimen
crystals
spectrometer
Prior art date
1971-10-05
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4606972A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1971-10-05
Filing date
1972-10-05
Publication date
1975-08-06
1972-10-05
Application filed by Siemens AG
filed
Critical
Siemens AG
1975-08-06
Publication of GB1402110A
publication
Critical
patent/GB1402110A/en
Status
Expired
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Abstract
1402110 X-ray spectrometers SIEMENS AG 5 Oct 1972 [5 Oct 1971] 46069/72 Heading G1A [Also in Division H5] In a multi-channel x-ray spectrometer which includes, within a vacuum vessel, an x-ray source for irradiating a specimen 1, and a plurality of spectrometer channels-each including an adjustable analyzer crystal and a detector-for receiving the resultant fluorescent radiation, the spectrometer channels lie in radial planes which intersect at the specimen, a pair of channels having input slits 9, Fig. 2, being mounted in each radial plane with their crystals arranged such that the diffracted beams defined by the channel exit slits 29 and 30 diverge, the crystal support for one channel being further from the sample than that for the other channel only to the extent required to accommodate the bearings of the two arms, and the angle between the two input arms being just sufficient to ensure that the line from the specimen to the crystal of the first channel clears the crystal mounting of the second channel. The detectors (not shown) may be counter tubes or scintillation counters, and the crystals may be bent in the form of logorithmic spirals. Threaded pins 27 and 28 act on spring-restrained levers 25 and 26 to permit fine adjustment of the crystals.
GB4606972A
1971-10-05
1972-10-05
X-ray spectrometer apparatus
Expired
GB1402110A
(en)
Applications Claiming Priority (1)
Application Number
Priority Date
Filing Date
Title
DE19712149611
DE2149611B2
(en)
1971-10-05
1971-10-05
MULTI-CHANNEL X-RAY SPECTROMETER
Publications (1)
Publication Number
Publication Date
GB1402110A
true
GB1402110A
(en)
1975-08-06
Family
ID=5821505
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
GB4606972A
Expired
GB1402110A
(en)
1971-10-05
1972-10-05
X-ray spectrometer apparatus
Country Status (5)
Country
Link
DE
(1)
DE2149611B2
(en)
FR
(1)
FR2155560A5
(en)
GB
(1)
GB1402110A
(en)
IT
(1)
IT968554B
(en)
NL
(1)
NL7213306A
(en)
Cited By (2)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US4475225A
(en)
*
1980-07-18
1984-10-02
Agence Nationale De La Valorisation De La Recherche (Anvar)
Measuring instrument for X-ray structure determinations of liquid or amorphous materials
CN102928450A
(en)
*
2012-10-23
2013-02-13
东莞市邦鑫伟业仪器有限公司
Beam-splitting vacuum chamber for fixed channel long-dispersion X fluorescence spectrophotometer
Families Citing this family (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
FI873627A
(en)
*
1987-08-25
1989-02-22
Leningradskoe Nauchno-Proizvodstvennoe Obiedinenie/Çburevestnikç
FLERKANALSROENTGENSPEKTROMETER.
1971
1971-10-05
DE
DE19712149611
patent/DE2149611B2/en
active
Granted
1972
1972-10-02
NL
NL7213306A
patent/NL7213306A/xx
not_active
Application Discontinuation
1972-10-03
IT
IT30005/72A
patent/IT968554B/en
active
1972-10-04
FR
FR7235128A
patent/FR2155560A5/fr
not_active
Expired
1972-10-05
GB
GB4606972A
patent/GB1402110A/en
not_active
Expired
Cited By (3)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US4475225A
(en)
*
1980-07-18
1984-10-02
Agence Nationale De La Valorisation De La Recherche (Anvar)
Measuring instrument for X-ray structure determinations of liquid or amorphous materials
CN102928450A
(en)
*
2012-10-23
2013-02-13
东莞市邦鑫伟业仪器有限公司
Beam-splitting vacuum chamber for fixed channel long-dispersion X fluorescence spectrophotometer
CN102928450B
(en)
*
2012-10-23
2015-09-23
东莞市邦鑫伟业仪器有限公司
A kind of light splitting vacuum chamber for fixing road wavelength dispersion X-fluorescence instrument
Also Published As
Publication number
Publication date
NL7213306A
(en)
1973-04-09
DE2149611A1
(en)
1973-04-19
FR2155560A5
(en)
1973-05-18
DE2149611B2
(en)
1976-11-11
IT968554B
(en)
1974-03-20
Similar Documents
Publication
Publication Date
Title
JPS6475950A
(en)
1989-03-22
Multiplex x rays spectrometer
US2837655A
(en)
1958-06-03
X-ray fluorescent analysis apparatus
US2602142A
(en)
1952-07-01
X-ray spectrograph
GB1465447A
(en)
1977-02-23
Radiation limiting device
GB1402110A
(en)
1975-08-06
X-ray spectrometer apparatus
US3102952A
(en)
1963-09-03
X-ray fluorescence analysis of multi-component systems
US2848624A
(en)
1958-08-19
Spectrochemical analysis device
Parrish
2013
Advances in X-ray diffractometry of clay minerals
US3699340A
(en)
1972-10-17
Compton spectrometer having primary and secondary detectors with low and high atomic numbers, respectively
Kohler et al.
1955
X‐Ray Diffractometry of Radioactive Samples
US3113464A
(en)
1963-12-10
Radio active transducer
US2485470A
(en)
1949-10-18
Method and apparatus for control of beam energy
GB1422329A
(en)
1976-01-28
DE2911596B2
(en)
1981-04-09
Measurement arrangement for X-ray fluorescence analysis
Hauser et al.
1966
Elastic scattering of 0.5 MeV gamma rays by heavy elements
GB1159905A
(en)
1969-07-30
X-Ray Generating Apparatus.
Comin et al.
1983
Glitches compensation in EXAFS data collection
Hodge
1967
A survey of HU regions in galaxies
US2882418A
(en)
1959-04-14
Analysis of unknown substances
US3715586A
(en)
1973-02-06
Liquid scintillation spectrometry system for sample analysis
Bensch et al.
1969
Rapid determination of radionuclide activities by a well-type gamma-ionization chamber
US2511151A
(en)
1950-06-13
X-ray apparatus and method
Sharma et al.
1965
X-Ray Yields from K-Shell Ionization by α Particles
SU507773A1
(en)
1976-03-25
Calibration method of radioisotope measuring device
Clare
1974
A high-efficiency polarimeter for 8 to 16 MeV protons
Legal Events
Date
Code
Title
Description
1975-12-17
PS
Patent sealed
1979-05-10
PCNP
Patent ceased through non-payment of renewal fee
