GB1516812A – Means and method for measuring levels of ionic contamination
– Google Patents
GB1516812A – Means and method for measuring levels of ionic contamination
– Google Patents
Means and method for measuring levels of ionic contamination
Info
Publication number
GB1516812A
GB1516812A
GB5743/77A
GB574377A
GB1516812A
GB 1516812 A
GB1516812 A
GB 1516812A
GB 5743/77 A
GB5743/77 A
GB 5743/77A
GB 574377 A
GB574377 A
GB 574377A
GB 1516812 A
GB1516812 A
GB 1516812A
Authority
GB
United Kingdom
Prior art keywords
ionic
assembly
ionic contamination
feb
contamination
Prior art date
1976-02-17
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5743/77A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kenco Alloy and Chemical Co Inc
Original Assignee
Kenco Alloy and Chemical Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
1976-02-17
Filing date
1977-02-11
Publication date
1978-07-05
1977-02-11
Application filed by Kenco Alloy and Chemical Co Inc
filed
Critical
Kenco Alloy and Chemical Co Inc
1978-07-05
Publication of GB1516812A
publication
Critical
patent/GB1516812A/en
Status
Expired
legal-status
Critical
Current
Links
Espacenet
Global Dossier
Discuss
Classifications
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/28—Testing of electronic circuits, e.g. by signal tracer
G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
G—PHYSICS
G01—MEASURING; TESTING
G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
G01N27/06—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a liquid
Abstract
1516812 Determining ionic contamination of electronics assemblies KENCO ALLOY & CHEMICAL CO Inc 11 Feb 1977 [17 Feb 1976] 05743/77 Heading G1N The ionic contamination of an electronic assembly is determined by placing the assembly into a known volume of solution of known ionic content and determining the resulting change in ionic content. The determination is preferably by conductivity measurement and the ionic content of the used solution may be returned to its original value by circulation through an ion removal column. The apparatus comprises a container shaped to receive the assembly.
GB5743/77A
1976-02-17
1977-02-11
Means and method for measuring levels of ionic contamination
Expired
GB1516812A
(en)
Applications Claiming Priority (1)
Application Number
Priority Date
Filing Date
Title
US05/658,182
US4023931A
(en)
1976-02-17
1976-02-17
Means and method for measuring levels of ionic contamination
Publications (1)
Publication Number
Publication Date
GB1516812A
true
GB1516812A
(en)
1978-07-05
Family
ID=24640230
Family Applications (1)
Application Number
Title
Priority Date
Filing Date
GB5743/77A
Expired
GB1516812A
(en)
1976-02-17
1977-02-11
Means and method for measuring levels of ionic contamination
Country Status (6)
Country
Link
US
(1)
US4023931A
(en)
JP
(2)
JPS5299894A
(en)
DE
(1)
DE2706834C2
(en)
FR
(1)
FR2342005A1
(en)
GB
(1)
GB1516812A
(en)
NL
(1)
NL7701496A
(en)
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
GB2128335A
(en)
*
1982-08-13
1984-04-26
Omnium Assets Trust Syndicate
Measuring conductivity of a soil sample
Families Citing this family (17)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US4434233A
(en)
1981-03-03
1984-02-28
Carrier Corporation
Method of testing oil for ionic contaminants
JPS59214750A
(en)
*
1983-05-20
1984-12-04
Mitsubishi Electric Corp
Continuous monitoring apparatus of sodium ion substance concentration
US4731154A
(en)
*
1986-06-23
1988-03-15
The Dow Chemical Company
Method and apparatus for quantitative measurement of organic contaminants remaining on cleaned surfaces
WO1988004962A1
(en)
*
1986-12-24
1988-07-14
Fry Metals Inc.
Apparatus and method for determining surface ionic contamination levels of electronic assemblies such as printed circuit assemblies
US4996160A
(en)
*
1987-06-09
1991-02-26
The Dow Chemical Company
Method and apparatus for quantitative measurement of ionic and organic contaminants remaining on cleaned surfaces
US4922205A
(en)
*
1989-06-08
1990-05-01
Rikagaku Kenkyusho
Apparatus for detecting contamination on probe surface
US5359282A
(en)
*
1990-11-16
1994-10-25
Nichimen Kabushiki Kaisha
Plasma diagnosing apparatus
US5201958A
(en)
*
1991-11-12
1993-04-13
Electronic Controls Design, Inc.
Closed-loop dual-cycle printed circuit board cleaning apparatus and method
JPH08211592A
(en)
*
1995-02-07
1996-08-20
Nikon Corp
Method and device for cleaning and drying
DE19607795C2
(en)
*
1996-03-01
1999-09-02
Temic Semiconductor Gmbh
Procedure for the investigation of ionic impurities inside molded electronic components
US6177279B1
(en)
*
1998-11-12
2001-01-23
Memc Electronic Materials, Inc.
Ion extraction process for single side wafers
US6367679B1
(en)
*
2000-06-28
2002-04-09
Advanced Micro Devices, Inc.
Detection of flux residue
JP2004077378A
(en)
*
2002-08-21
2004-03-11
Somakkusu Kk
Apparatus for measuring degradation of electrolytic cleaning liquid and method for evaluating degree of degradation of electrolytic cleaning liquid using the same
KR101240333B1
(en)
*
2007-08-24
2013-03-07
삼성전자주식회사
Apparatus and Method of analyzing ions adsorbed on surface of mask
CN101334432B
(en)
*
2008-07-10
2010-06-09
广东正业科技有限公司
Ion pollution detection device
WO2010030505A1
(en)
*
2008-09-10
2010-03-18
Austin American Technology Corporation
Cleaning and testing ionic cleanliness of electronic assemblies
DE102016113072A1
(en)
*
2016-07-15
2018-01-18
Microtronic Produktions Gmbh
Contamination tester for testing ionic contamination of printed circuit boards
Family Cites Families (5)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
US3366554A
(en)
*
1964-01-06
1968-01-30
Boeing Co
Method for evaluating coating discontinuities
US3490873A
(en)
*
1965-08-10
1970-01-20
United Aircraft Corp
Method and composition for inspecting semiconductor devices
US3459505A
(en)
*
1965-10-11
1969-08-05
United Carr Inc
Method of testing the porosity of coated articles
JPS5221916B2
(en)
*
1972-04-26
1977-06-14
DE2514905A1
(en)
*
1974-04-10
1975-10-23
Philips Nv
CONDUCTOMETRIC ANALYSIS
1976
1976-02-17
US
US05/658,182
patent/US4023931A/en
not_active
Expired – Lifetime
1977
1977-01-21
JP
JP504277A
patent/JPS5299894A/en
active
Pending
1977-02-11
GB
GB5743/77A
patent/GB1516812A/en
not_active
Expired
1977-02-11
NL
NL7701496A
patent/NL7701496A/en
not_active
Application Discontinuation
1977-02-16
FR
FR7704411A
patent/FR2342005A1/en
active
Granted
1977-02-17
DE
DE2706834A
patent/DE2706834C2/en
not_active
Expired
1983
1983-04-11
JP
JP1983052770U
patent/JPS58175451U/en
active
Granted
Cited By (1)
* Cited by examiner, † Cited by third party
Publication number
Priority date
Publication date
Assignee
Title
GB2128335A
(en)
*
1982-08-13
1984-04-26
Omnium Assets Trust Syndicate
Measuring conductivity of a soil sample
Also Published As
Publication number
Publication date
FR2342005A1
(en)
1977-09-16
FR2342005B1
(en)
1980-11-14
NL7701496A
(en)
1977-08-19
JPS5299894A
(en)
1977-08-22
JPH0119082Y2
(en)
1989-06-02
US4023931A
(en)
1977-05-17
DE2706834A1
(en)
1977-08-18
JPS58175451U
(en)
1983-11-24
DE2706834C2
(en)
1986-06-19
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Legal Events
Date
Code
Title
Description
1978-11-08
PS
Patent sealed [section 19, patents act 1949]
1993-10-06
PCNP
Patent ceased through non-payment of renewal fee
Effective date:
19930211
